Skewed-Load Test Cubes Based on Functional Broadside br Tests for a Low-Power Test Set br br A low-power test generation procedure that was developed br earlier merges broadside test cubes that are derived from functional broadside tests in order to generate a low-power broadside test set. This has several advantages, most importantly, that test cubes, which are derived from functional broadside tests, create functional operation conditions in subcircuits around the sites of detected faults. These conditions are preserved when a test cube is merged with other test cubes. br This brief applies a similar approach to the generation of a low-power skewed-load test set. The main challenge that this paper addresses is the derivation of skewed-load test cubes from functional broadside tests.